An AFM instrument uses a probe with an atomically sharp tip to scan over the surface of a material. There are two main scanning modes with an AFM instrument: contact or dynamic (tapping) mode. Both ...

A research team led by Prof. Long Shibing from the University of Science and Technology of China (USTC) of the Chinese Academy of Sciences (CAS) has, for the first time, made spintronic neuromorphic ...

The high-resolution imaging capability of atomic force microscopy (AFM) can be extended to enable a wide range of characterization methods to study electrical, mechanical, thermal, and other ...