EDN

Consortium pushes ATE interface, probe-card standards

SAN JOSE, Calif. &#151 In what could simultaneously lower chip-testing costs and turn the industry upside down, a consortium in the automatic test equipment (ATE) field has expanded its charter, by ...
Seeking Alpha

Keysight Launches New High-Power ATE Test Solutions to Tackle Growing Power Validation Challenges

New portfolio of compact, regenerative power supplies and loads helps engineers address complexity, space, and sustainability demands in modern test environments SANTA ROSA, Calif.--(BUSINESS WIRE)-- ...
Semiconductor Engineering

Challenges And Outlook Of ATE Testing For 2nm SoCs

The transition to the 2nm technology node introduces unprecedented challenges in Automated Test Equipment (ATE) bring-up and manufacturability. As semiconductor devices scale down, the complexity of ...
Semiconductor Engineering

A Customized Low-Cost Approach For S-Parameter Validation Of ATE Test Fixtures

This article summarizes the content of a paper jointly developed and presented by Advantest and Infineon at TestConX 2022. Device under test (DUT) fixtures for ATE systems pose several verification ...