A collaborated research team led by Prof. MA Yanwei from the Institute of Electrical Engineering (IEE) of Chinese Academy of Sciences (CAS), has shattered records in the current-carrying performance ...
Researchers and industries have been using transmission electron microscopy (TEM) to study semiconductors' stacking and dislocation faults. This article considers the analysis of crystal structures.
Recent experimental findings from the research team led by Prof. Jianbo Hu at the Institute of Fluid Physics, China Academy of Engineering Physics (CAEP), revealed partial dislocation-mediated plastic ...
Researchers discovered that crystal dislocations in antiferroelectric PbZrO3 thin films generate ordered polar antihedgehog lattices, creating a new defect-engineering approach for polar topologies.
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