Delay-inducing defects are causing increasing concern in the semiconductor industry today, particularly at the leading-edge 130- and 90- nanometer nodes. To effectively test for such defects, the ...

The 2002 NEC implemented new requirements to help reduce the number of electrical fires caused by parallel arc faults in branch circuit wiring. All branch circuits supplying bedrooms in single-family ...

EAST AURORA, N.Y.--(BUSINESS WIRE)--Astronics Corporation (NASDAQ:ATRO), a leading provider of advanced technologies for the global aerospace, defense and semiconductor industries, announced today ...

Test point selection and fault diagnosis remain critical challenges in the analysis and maintenance of analog systems. As these systems operate with continuous-valued signals and are susceptible to ...

A new technical paper titled “Aging Aware Steepening of the Fault Coverage Curve of a Scan Based Transition Fault Test Set” was published by researchers at Purdue University. “Chip aging may result in ...

When semiconductor devices had geometries of 0.18 microns and larger, most defects manifested themselves as static faults. Test strategies based on stuck-at fault-model scan patterns and standard ...

Download this article in PDF format. Finding the right balance among test cost, test quality, and data collection for running diagnosis requires consideration of several competing factors. Luckily ...

The Smart-Thump from HDW Electronics is a fully integrated underground cable fault locating system that requires less training than a traditional thumper because it interprets the results of the ...

New non-volatile memories (NVM) bring new opportunities for changing how we use memory in systems-on-chip (SoCs), but they also add new challenges for making sure they will work as expected. These new ...

HVI can engineer and assemble a complete package for cable testing and/or fault locating, installed on a common platform ready to drop into your van or truck. Aug. 18, 2009 HVI can engineer and ...