An optimal way to determine an op amp's input capacitance. Steps involved in making the input-capacitance measurement. 1. With a series resistor at the op-amp input, the input capacitance of the op ...
This paper defines a method to measure the chip die pad capacitance using time delay reflectometry (TDR). This method is useful for measuring the low-value capacitance that is present at the end of a ...
This article summarizes the content of a paper jointly developed and presented by Advantest and Infineon at TestConX 2022. Device under test (DUT) fixtures for ATE systems pose several verification ...
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