TERS continues to see widespread and beneficial use in the analysis of nanoscale heterogeneities and defects in ...

Expanding our understanding of a particular process, material, or mechanism usually requires taking a close look at what is going on. Researchers in Japan have now observed the nanoscale behavior of ...

AFM is a scanning probe microscopic instrument that consists of a force-sensing microcantilever, a laser source, a piezoelectric scanner and a photodiode detector (Figure 1A). During AFM imaging, the ...

Researchers have used tip-scan high-speed atomic force microscopy combined with an optical microscope to observe light-induced deformation of azo-polymer films. The process could be followed in real ...