Dual-frequency resonance tracking (DFRT) is a technique that utilizes contact mode atomic force microscopy (AFM) to measure a sample’s weak electrical or mechanical responses. Conventional resonance ...

In nature, as in everyday life, we are surrounded by resonance—the phenomenon that describes how each object has a frequency that it prefers to vibrate at. The note of a guitar string and the sound of ...

Quantitative characterization of nanomechanical properties has invariably been a holy grail for atomic force microscopy. This article explains some of the industry’s earlier attempts made at ...

Download this article in PDF format. Jacques and Pierre Curie, French physics, discovered the piezoelectric effect in 1880. When some solid material is mechanically compressed or stressed, the ...