Electronic Design

Test Setup Checks Transistors’ hFEs When Tight Control Is Important

This file type includes high resolution graphics and schematics. The spread of h FE values in a batch of transistors may be wide enough to cause unreliable performance during mass production of a ...
Electronic Design

System-level test contends with billions of untested transistors

Why might you need semiconductor system-level test (SLT)? As Karthik Ranganathan, director for semiconductor solutions at Astronics Test Systems, points out, if you test a 22-nm, ...
Tech Xplore

Practical design guidelines for atom-thin oxide transistors enable reliable 3D chip integration

Researchers at National Taiwan University have developed a unified model that explains how thickness, defects, interface ...