On-wafer probing techniques have become indispensable in the precise characterisation of semiconductor devices operating in the microwave and terahertz regions. These techniques enable the direct ...

Semiconductor testing has traditionally functioned as a stable screening step in the manufacturing flow so that failing ...

FormFactor, Inc. (NASDAQ: FORM), a leading provider of RF probe stations and probe cards, and Rohde & Schwarz, a global leader in test and measurement, today announced a strategic co-marketing ...

New market study finds that the top six manufacturers of Wafer Test Probe Card occupied nearly 72.09% global market share. LEWES, DELAWARE, UNITED STATES, November 30 ...

On-wafer measurement techniques provide an essential pathway for characterising the performance of semiconductor devices at millimetre-wave frequencies. By directly interfacing with devices on the ...

PI's latest 6-axis alignment system is available in one-sided and double-sided configurations, upright for PIC assembly or inverted, for photonics wafer-probing applications. (Nanowerk News) PI ...

TOKYO, Dec. 07, 2023 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced three new additions to its suite of memory test products. The ...

I’ve had a fairly varied early part of my career in the semiconductors business: a series of events caused me to jump disciplines a little bit, and after one such event, I landed in the test ...

The semiconductor industry is changing rapidly, with one of the biggest developments being the move from traditional pogo-based die probing to photonic beam probing for Very-Large-Scale Integration ...

Partially defective, marginal die can still be functional enough to pass final electrical test. Some of these “walking wounded” chips get past final testing, but in the customer’s end product, under ...