Ministry of Testing is where software testing and quality engineering professionals grow their careers. Reach new heights ...

Identify sources of unnecessary cognitive load and apply strategies to focus on meaningful analysis and exploration.

The U.S.-based metrology equipment manufacturer has launched a non-contact photoluminescent imaging system to reveal defects and other non-uniformities in silicon, thin film, and III-V multijunction ...

Semiconductor manufacturer GlobalFoundries developed three practical AI-based solutions. The solutions assist with ...

The small and complicated features of TSVs give rise to different defect types. Defects can form during any of the TSV ...

Choosing the right test management tool directly impacts your team's ability to ship quality software fast. QA teams today juggle manual tests, automated suites, scattered documentation, and ...

From generating test cases and transforming test data to accelerating planning and improving developer communication, AI is having a profound impact on software testing. The integration of artificial ...

Defects that escape into production during migrations quietly multiply cost, risk and compliance exposure – quality built in (not bolted on) is now a national competitiveness issue. Issued by Kinetic ...

When it comes to non-destructive testing (NDT), choosing the right defect recognition software for manufacturing is critical. When it comes to non-destructive testing (NDT), choosing the right defect ...

Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with content, and download exclusive resources. Cory Benfield discusses the evolution of ...

Final electrical test remains one of the best ways to assess a circuit’s ultimate viability. But we know that, unfortunately, even 100% end-of-line electrical testing of semiconductor wafers will not ...